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State of Patent:Pending patent
Application Date:2019-05-27
First Author:韩景智
Application Date: 2019-05-27
韩景智
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Gender: Male
Education Level: Postgraduate (Doctoral)
Alma Mater: 北京科技大学
Patents
一种测量弱磁性La1-xSrxMnO3外延薄膜层状磁结构的方法