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俞大鹏
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论文成果
Transmission electron microscopy investigation of inversion domain boundary in Al0.65Ga0.35N grown on AlN/sapphire template
发布时间:2019-11-13点击次数:
发表刊物:
APPLIED PHYSICS LETTERS
备注:
112106,2009
是否译文:
否
全部作者:
Sang, L. W.; Fang, H.; Qin, Z. X.; 等