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俞大鹏
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俞大鹏
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论文成果
Microanalyses of the reverse-bias leakage current increase in the laser lift off GaN-based light emitting diodes
发布时间:2019-11-13点击次数:
发表刊物:
JOURNAL OF APPLIED PHYSICS
备注:
2009
是否译文:
否
全部作者:
Sun, Yongjian; Yu, Tongjun; Zhao, Huabo; 等