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俞大鹏
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俞大鹏
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论文成果
Failure mechanism analysis of electromigration dominated damage in TiSi(2) nanowires
发布时间:2019-11-13点击次数:
发表刊物:
JOURNAL OF APPLIED PHYSICS
备注:
2009
是否译文:
否
全部作者:
Zou, Chen-Xia; Xu, Jun; Zhang, Xin-Zheng; 等