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论文成果
Tem study of the microstructure and interfaces in YBa2Cu3Oy thin films grown on silicon with a Eu2CuO4/Y-ZrO2 bi-layer buffer
发布时间:2019-11-13点击次数:
发表刊物:
SURFACE REVIEW AND LETTERS
备注:
2007
是否译文:
否
全部作者:
Gao, J.; Fu, E. G.; Luo, Z.; 等